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CATEC collaborates with the company ONTECH for the development of new solutions for pavement inspections at airports


June 14th 2017

The initiative is part of the APIA project, which leads the Andalusian engineering GHENOVA and seeks to improve the detection of defects in runways and aerial landings


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Our team is collaborating with the Andalusian company ONTECH for the development of new solutions for pavement inspections. This initiative is part of the APIA (Automatic Pavement Index Assessment) project, which aims to develop a new inspection system to improve the detection of defects in the runways and take-off of airports, reducing costs and inspection time while increasing the quality of records.

To achieve this, CATEC is using the latest non-destructive techniques in an infrared thermography (IRT) assisted inspection system, a high level programming language and image processing technique, using the ATLAS Experimental Flight Center facilities.

The APIA project is led by the Spanish engineering company Ghenova and also integrated by the company MC2 and the CITIC technology center. APIA is a project co-financed by Centre for the Development of Industrial Technology (CDTI) within the European Regional Development Fund (ERDF)-Innterconecta 2015.
CATEC collaborates with the company ONTECH for the development of new solutions for pavement inspections at airports



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